ITC 2010 - Call for Papers

CALL FOR PAPERS

Scope -- Paper Submissions -- Poster Submissions -- Key Dates -- Additional Information -- Committees

Scope

ITC is the industry's premier conference dedicated to the electronic test of semiconductors, boards, and systems. A wide range of events including: paper sessions, tutorials, panels, advanced industrial practice presentations, a lecture series, a poster session, workshops, exhibits, and a host of networking and social opportunities await you. You are encouraged to actively participate by submitting a paper. Following is a list of Conference Focus Topics. Additional topics are listed on the Call for Papers announcement on the ITC website.

Conference Focus Topics

Design for Manufacturability
Yield Analysis & Optimization
Embedded Instruments (BIST & DFT)
Design for Reliability and Reliability Screening
Low-Cost Test
Diagnosis & Silicon Debug
Fault Modeling of New Defects
Load boards & Probe-cards
System Test in Application Environment
Emerging Test Problems (display, 3D, MEMS, solar, imaging sensors)
Design, Test, and Yield for 45nm and Beyond
Test Optimization across Supply-chains
Experiments and Case Studies
Standalone Memory Test & Repair (DRAM, Flash, Emerging)

Presenting a paper at ITC provides peer recognition and an opportunity to win the ITC Ned Kornfeld Best Paper Award, which includes a cash prize. The latest winners of the award from Advanced Micro Devices were recognized at the ITC 2009 plenary session by the General Chair Gordon Roberts. Their paper from ITC2008 was titled "Test Access Mechanism for Multiple Identical Cores".

The Test Week advance program and registration information will be available in July. Visit www.itctestweek.org often to get the latest event information.

Paper Submissions

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Authors are invited to submit original, unpublished papers describing recent work in the field of test and design. In addition, authors are invited to submit practical, industry best practices to be included in application/lecture series sessions. Submissions simultaneously under review or accepted by another conference, symposium or journal, will be rejected.
Submissions must include:

Title of paper.
Name, affiliation, mailing address, e-mail address, phone and fax number of each author.
Designation of the presenter(s). ITC will communicate with the presenter.
One or two topic(s) from the topic list, or a description of your topic.
An electronic copy of a complete paper of 10 pages maximum, or an extended summary of from four to six pages. Submissions of less than four pages are rarely accepted.
An abstract of 35 words or less.

ITC maintains a highly competitive selection process for papers presented. Submissions must clearly describe the status of the reported work, its significance and highlights. Supporting data, results and conclusions, and references to prior work must also be included. ITC does not accept submissions that do not meet all specified criteria.

Poster Submissions

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Authors are also invited to submit a single-page poster proposal. Posters are a useful way of presenting late-breaking results, getting feedback on an innovative method, or participating without having to write a full paper. Acceptance as a poster does not preclude submission of a more complete treatment as an ITC paper in 2011. Poster proposal submissions should follow the same guidelines as paper submissions shown above.

Key Dates

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Paper submission deadline: March 17, 2010 (Submission deadline is firm.)
Notification of acceptance: June 22, 2010
Final copy deadline: August 17, 2010

Poster submission deadline: June 20, 2010
Author notification: July 8, 2010
One-page paper due: July 17, 2010

Additional Information

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Panel organizers are invited to submit panel ideas to highlight new developments and trends in test, to invite group discussion on controversies in test approaches, or to educate the audience on new standards or practices. Submissions must describe the area and possible positions of different panelists. The deadline for panel proposal submissions is: March 17, 2010.

Test Week tutorial and workshop proposals are also welcomed. Deadlines and other information about proposals can be obtained from TTTC at: http://tab.computer.org/tttc

For detailed information about the submission process, requirements and deadlines, the selection process and any other questions regarding the program itself or contact information, please consult the ITC web sites at http:/www.itctestweek.org.

Committees

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Program Chair
Dr. Erik H. Volkerink
Erik.Volkerink@Verigy.com
+1 408 864 7661

For more information, visit us on the web at: http:/www.itctestweek.org

The International Test Conference (ITC/Test Week 2010) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).